Customized Scanning Probe Microscopy (SPM) Tips

Overview

While the advancement of future nanotechnologies and materials is a global scientific endeavor, the requirements of each research effort is unique. Paramount Sensors specializes in customizing advanced nanoprobes and services. We guarantee the highest standards of quality and precision. Our customized tips are fabricated using cutting-edge fabrication, characterization, and packaging technologies. Our materials exhibit the highest purity standards and are further structured to produce uniform and reproducible thin films.

The following types of nanoprobes are currently available for customization:

AFM Tips for Surface Analysis Applicationsvisible-tip
  • Coated with ultrathin non-oxidizing coating (proprietary) to produce Atomic Force Microscopy (AFM) tips with consistent properties. Available for all AFM scanning modes (force modulation, tapping/non-contact/contact mode, and ultrahigh frequency).
  • Tip radius-of-curvature guaranteed < 10 nm for standard probes (after coating!)
  • Tip radius-of-curvature guaranteed < 5 nm for ultrahigh resolution probes (after coating!)
  • Options•Visible-tip probes  •Cantilever backside coating (Au, Al, Pt, or Pd-based)  •High resolution SEM images of the tips apex •Tip Aspect Ratio 
 
MFM Tips for Magnetic Applications (click here for more info.)custom mfm-hr probe
  • Coated with a variety of magnetic compositions (proprietary) to produce desired magnetic properties for magnetic force microscopy (MFM) and/or magnetoresistive scanning microscopy (MSM) modes.
  • Options•Coercivity  •Magnetic moment  •Tip magnetization  (high coercivity probes only)  •Tip radius-of-curvature and aspect-ratio  •Protection layer coating thickness  •Cantilever backside coating (Au, Al, Pt, or Pd-based)  •High-resolution SEM images of the tips apex  •Cantilever mechanical properties 
 
 
SThM Tips for Thermal ApplicationsSThM Image
  • FIB-modified scanning thermal microscopy (SThM) probes by Kelvin Nanotechnology to produce higher thermal resolution.
  • Options:  •Resistive element dimensions  • Physical tip dimensions  •Resistive element composition and thickness
 

 

 
Plateau TipsPlateau Tip
  • FIB-fabricated from standard highly-doped silicon probes. Available for all AFM scanning modes (force modulation, tapping/non-contact/contact mode, and ultrahigh frequency).
  • Options: •Plateau diameter between 100 nm - 2000 nm  •Tip height and angle (up to ±20° with respect to probe central axis)  •Client's choice of plateau-side coating composition and thickness  •Cantilever backside coating (Au, Al, Pt, or Pd-based)  •High-resolution SEM images of the plateau tips 
 
NSOM/SNOM Tips for Optical Near-field ApplicationsNSOM Tip
  • FIB-defined apertures on aluminum-based hallow probes for near-field scanning optical microscopy (NSOM/SNOM) imaging.
  • Options:  •Client's choice of tip-side coating composition and thickness on SiO2 hollow-pyramid probes  •Aperture size and shape  •High-resolution SEM images of the apertures
 
 
 
EFM Tips for Electrical and Biological Applications
  • Coated with gold, tungsten, platinum, or palladium thin films. Available for all AFM scanning modes (force modulation, tapping/non-contact/contact mode, and ultrahigh frequency).
  • Options: •Composition thin film thickness  •Tip radius-of-curvature and aspect-ratio •Visible-tip probes  •Cantilever backside coating (Au, Al, Pt, or Pd-based)  •High-resolution SEM images of the tip apex

 

*Please visit our gallery for the images specifications and more demonstrations.
**Please contact us for further customization options.

Ordering

  • Please contact us with your customization needs to request a formal quote
  • Payments: Business check, wire transfer or major credit cards (Visa, MasterCard®, Discover™, American Express®)
  • Shipping Terms: Prepaid or purchasing order issued
  • Delivery Time/Method: Depends on the customization requested, quantity of probes, and date of order. Products are shipped via UPS (VIP services are available for urgent orders).

Note: ♦Shipping charges and sales tax may apply ♦Terms of Sale

Professional services

    • Customized Nanoprobes
    • Sample Investigation
    • Failure Analysis
    • Consulting
    • Training

    *Contact us to learn more...